System calibration and statistical image reconstruction for ultra-high resolution stationary pinhole SPECT

Translated title of the contribution: System calibration and statistical image reconstruction for ultra-high resolution stationary pinhole SPECT

F. van der Have, B. Vastenhouw, M.C.M. Rentmeester, F.J. Beekman

Research output: Contribution to journal › Article › Academic › peer-review

Translated title of the contribution	System calibration and statistical image reconstruction for ultra-high resolution stationary pinhole SPECT
Original language	Undefined/Unknown
Pages (from-to)	960-971
Number of pages	12
Journal	IEEE Transactions on Medical Imaging
Volume	27
Issue number	7
Publication status	Published - 2008

Cite this

@article{fed69d91b28d4dabb1a07f22beb37ec7,

title = "System calibration and statistical image reconstruction for ultra-high resolution stationary pinhole SPECT",

author = "{van der Have}, F. and B. Vastenhouw and M.C.M. Rentmeester and F.J. Beekman",

year = "2008",

language = "Undefined/Unknown",

volume = "27",

pages = "960--971",

journal = "IEEE Transactions on Medical Imaging",

issn = "0278-0062",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "7",

}

TY - JOUR

T1 - System calibration and statistical image reconstruction for ultra-high resolution stationary pinhole SPECT

AU - van der Have, F.

AU - Vastenhouw, B.

AU - Rentmeester, M.C.M.

AU - Beekman, F.J.

PY - 2008

Y1 - 2008

M3 - Article

SN - 0278-0062

VL - 27

SP - 960

EP - 971

JO - IEEE Transactions on Medical Imaging

JF - IEEE Transactions on Medical Imaging

IS - 7

ER -