Leaf trajectory verification during dynamic intensity modulated radiotherapy using an amorphous silicon flat panel imager

Translated title of the contribution: Leaf trajectory verification during dynamic intensity modulated radiotherapy using an amorphous silicon flat panel imager

J.J. Sonke, L.S. Ploeger, B. Brand, M.H. Smitsmans, M. van Herk

Research output: Contribution to journalArticleAcademicpeer-review

Translated title of the contributionLeaf trajectory verification during dynamic intensity modulated radiotherapy using an amorphous silicon flat panel imager
Original languageUndefined/Unknown
Pages (from-to)89-95
Number of pages7
JournalMedical Physics
Volume31
Issue number2
Publication statusPublished - 2004

Keywords

  • Econometric and Statistical Methods: General
  • Geneeskunde(GENK)
  • Algemeen onderzoek
  • Internal medicine

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