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FAST-EM array tomography: a workflow for multibeam volume electron microscopy

  • Arent J Kievits
  • , B H Peter Duinkerken
  • , Ryan Lane
  • , Cecilia de Heus
  • , Daan van Beijeren Bergen En Henegouwen
  • , Tibbe Höppener
  • , Anouk H G Wolters
  • , Nalan Liv
  • , Ben N G Giepmans
  • , Jacob P Hoogenboom

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

Elucidating the 3D nanoscale structure of tissues and cells is essential for understanding the complexity of biological processes. Electron microscopy (EM) offers the resolution needed for reliable interpretation, but the limited throughput of electron microscopes has hindered its ability to effectively image large volumes. We report a workflow for volume EM with FAST-EM, a novel multibeam scanning transmission electron microscope that speeds up acquisition by scanning the sample in parallel with 64 electron beams. FAST-EM makes use of optical detection to separate the signals of the individual beams. The acquisition and 3D reconstruction of ultrastructural data from multiple biological samples is demonstrated. The results show that the workflow is capable of producing large reconstructed volumes with high resolution and contrast to address biological research questions within feasible acquisition time frames.

Original languageEnglish
Pages (from-to)49-64
Number of pages16
JournalMethods in microscopy
Volume1
Issue number1
DOIs
Publication statusPublished - Apr 2024

Keywords

  • volume electron microscopy
  • FAST-EM
  • array tomography
  • image processing
  • automatic segmentation

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