Evaluation of image-based bias field correction at 7T

Mike van Rijssel, JPW Pluim, Bas van der Velden, Tijl van der Velden, E Krikken, Jannie Wijnen, Kenneth Gilhuijs, DWJ Klomp

Research output: Contribution to conferenceAbstractOther research output

3 Downloads (Pure)
Original languageEnglish
PagesS316-7
Number of pages2
DOIs
Publication statusPublished - Oct 2015
EventESMRMB - Edinburgh, United Kingdom
Duration: 1 Oct 20153 Oct 2015

Conference

ConferenceESMRMB
Country/TerritoryUnited Kingdom
CityEdinburgh
Period1/10/153/10/15
  • ESMRMB

    Mike van Rijssel (Participant)

    1 Oct 20153 Oct 2015

    Activity: Participating in or organising an eventParticipation in conferenceAcademic

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