TY - GEN
T1 - Detecting virulent cells of Cryptococcus neoformans yeast
T2 - 18th International Conference on Pattern Recognition, ICPR 2006
AU - Jinshuo, Liu
AU - Van Der Putten, Peter
AU - Hagen, Ferry
AU - Xinmeng, Chen
AU - Boekhout, Teun
AU - Verbeek, Fons J.
PY - 2006
Y1 - 2006
N2 - The yeast Cryptococcus neoformans can cause dangerous infections such as meningitis. The presence of a thick capsule is shown to be correlated with virulence of a yeast cell. This paper reports on our approach towards developing a classifier for detecting virulent cells in images. We present our methods for creating samples, collecting images, preprocessing the images, identifying cells and creating features for each cell. Unsupervised clustering experiments have provided preliminary evidence that our methods results in features that can successfully be used to group and distinguish virulent from normal cells. In our future work we plan to use the same methods and feature set to build supervised classification models.
AB - The yeast Cryptococcus neoformans can cause dangerous infections such as meningitis. The presence of a thick capsule is shown to be correlated with virulence of a yeast cell. This paper reports on our approach towards developing a classifier for detecting virulent cells in images. We present our methods for creating samples, collecting images, preprocessing the images, identifying cells and creating features for each cell. Unsupervised clustering experiments have provided preliminary evidence that our methods results in features that can successfully be used to group and distinguish virulent from normal cells. In our future work we plan to use the same methods and feature set to build supervised classification models.
UR - https://www.scopus.com/pages/publications/34047205668
U2 - 10.1109/ICPR.2006.437
DO - 10.1109/ICPR.2006.437
M3 - Conference contribution
AN - SCOPUS:34047205668
SN - 0769525210
SN - 9780769525211
T3 - Proceedings - International Conference on Pattern Recognition
SP - 1112
EP - 1115
BT - Proceedings - 18th International Conference on Pattern Recognition, ICPR 2006
PB - IEEE
Y2 - 20 August 2006 through 24 August 2006
ER -