Classification of yeast cells from image features to evaluate pathogen conditions

  • Peter Van Der Putten
  • , Laura Bertens
  • , Jinshuo Liu
  • , Ferry Hagen
  • , Teun Boekhout
  • , Fons J. Verbeek*
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

Morphometrics from images, image analysis, may reveal differences between classes of objects present in the images. We have performed an image-features-based classification for the pathogenic yeast Cryptococcus neoformans. Building and analyzing image collections from the yeast under different environmental or genetic conditions may help to diagnose a new "unseen" situation. Diagnosis here means that retrieval of the relevant information from the image collection is at hand each time a new "sample" is presented. The basidiomycetous yeast Cryptococcus neoformans can cause infections such as meningitis or pneumonia. The presence of an extra-cellular capsule is known to be related to virulence. This paper reports on the approach towards developing classifiers for detecting potentially more or less virulent cells in a sample, i.e. an image, by using a range of features derived from the shape or density distribution. The classifier can henceforth be used for automating screening and annotating existing image collections. In addition we will present our methods for creating samples, collecting images, image preprocessing, identifying "yeast cells" and creating feature extraction from the images. We compare various expertise based and fully automated methods of feature selection and benchmark a range of classification algorithms and illustrate successful application to this particular domain.

Original languageEnglish
Title of host publicationProceedings of SPIE-IS and T Electronic Imaging - Multimedia Content Access
Subtitle of host publicationAlgorithms and Systems
PublisherSPIE
ISBN (Print)0819466190, 9780819466198
DOIs
Publication statusPublished - 2007
Externally publishedYes
EventMultimedia Content Access: Algorithms and Systems - San Jose, CA, United States
Duration: 31 Jan 20071 Feb 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6506
ISSN (Print)0277-786X

Conference

ConferenceMultimedia Content Access: Algorithms and Systems
Country/TerritoryUnited States
CitySan Jose, CA
Period31/01/071/02/07

Keywords

  • Cryptococcus neoformans
  • Feature selection
  • Image analysis
  • Image retrieval
  • Microscopy
  • Yeast

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